{"id":610,"date":"2022-06-03T14:10:54","date_gmt":"2022-06-03T05:10:54","guid":{"rendered":"https:\/\/imnc.jp\/2026\/?page_id=610"},"modified":"2026-04-30T20:17:55","modified_gmt":"2026-04-30T11:17:55","slug":"symp-a","status":"publish","type":"page","link":"https:\/\/imnc.jp\/2026\/symp-a\/","title":{"rendered":"Symposium A"},"content":{"rendered":"\n<table id=\"tablepress-17\" class=\"tablepress tablepress-id-17\">\n<tbody>\n<tr class=\"row-1\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:24px;\">Symposium A: AI \u00d7 High-NA EUV \u00d7 Novel Materials \u00d7 Sustainability<\/font><\/strong><br \/>\n<div style=\"font-size:18px;\">Organizers<br \/>\nTetsuo Harada (Univ. of Hyogo), Kentaro Matsunaga (Kioxia), Keiichiro Hitomi (Hitachi), Makoto Sakakibara (Hitachi High-Tech), Kuen-Yu Tsai (Natl. Taiwan Univ.), Junichi Yanagisawa (Univ. of Shiga Pref.), Toru Fujimori (Hitachi High-Tech), Julius Santillan (AIST), Fumihiko Hirose (Yamagata Univ.) and Seiji Nagahara (ASML)<\/td>\n<\/tr>\n<tr class=\"row-2\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Prof. Takahiro Kozawa, The University of Osaka, Japan<\/Strong><\/Font><\/td>\n<\/tr>\n<tr class=\"row-3\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Dr. Arame Thiam, Tokyo Electron Europe, Belgium<\/Strong><\/Font><br \/>\n<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/imnc.jp\/2026\/wp-content\/uploads\/2026\/06\/Dr.Arame_.jpg\" alt=\"\" width=\"120\" height=\"120\" class=\"alignnone size-full wp-image-4009\" \/><br \/>\n<\/Strong><div style=\"font-size:15px;\"><strong>Paper Title<\/Font><\/strong><br \/>\nNovel Patterning Technologies enabling High NA EUV Logic and DRAM features scaling<br \/>\n<strong>Short Biography<\/strong><br \/>\nDr Arame Thiam is Senior Process Engineer at Tokyo Electron Belgium. She supports High NA EUV lithography joint learning program with imec, focusing on patterning exploration for Logic advanced technology nodes. After starting her career in CEA-Leti Grenoble Patterning group working on e-beam lithography, she joined Imec in 2015. Her focus was lithography process development support of Imec Interconnects, Beyond CMOS, OIO and Quantum computing programs.<br \/>\nShe received her M.Sc. and PhD in Microelectronics and Nanotechnologies from the University of Lille 1 (France).<br \/>\n<\/td>\n<\/tr>\n<tr class=\"row-4\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Prof. Tsumoru Shintake, Okinawa Institute of Science and Technology, Japan<\/Strong><\/Font><br \/>\n<\/td>\n<\/tr>\n<tr class=\"row-5\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Dr. Anuja De Silva, Lam Research, USA<\/Strong><\/Font><br \/>\n<\/td>\n<\/tr>\n<tr class=\"row-6\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Dr. Toshiaki Tanigaki, Hitachi, Ltd., Japan<\/Strong><\/Font><br \/>\n<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/imnc.jp\/2026\/wp-content\/uploads\/2026\/07\/Tanigaki_sama.jpg\" alt=\"\" width=\"120\" height=\"120\" class=\"alignnone size-full wp-image-4103\" \/><br \/>\n<\/Strong><div style=\"font-size:15px;\"><strong>Paper Title<\/Font><\/strong><br \/>\nElectromagnetic Field Observations for Novel Materials by Electron Holography<br \/>\n<strong>Short Biography<\/strong><br \/>\nToshiaki Tanigaki is a Principal Researcher at Hitachi, Ltd.\u2019s Research and Development Group. He received his PhD from Ritsumeikan University in 2004 and was a visiting researcher at RIKEN under Dr. Akira Tonomura\u2019s FIRST Program from 2010 to 2014. Joining Hitachi in 2014, he became a Project Leader in 2019. His research centers on advanced electron microscopy, including a 1.2 MV aberration-corrected holography electron microscope, for high-precision imaging of electromagnetic fields and their applications in physics, materials science, and industry. He received the Seto Award from the Japanese Society of Microscopy in 2023.<\/td>\n<\/tr>\n<tr class=\"row-7\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Dr. Luciana Meli, IBM Research, USA<\/Strong><\/Font><br \/>\n<\/td>\n<\/tr>\n<tr class=\"row-8\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Dr. Ivan Pollentier, imec, Belgium<\/Strong><\/Font><br \/>\n<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/imnc.jp\/2026\/wp-content\/uploads\/2026\/07\/Dr.Ivan-Pollentier.jpg\" alt=\"\" width=\"120\" height=\"120\" class=\"alignnone size-full wp-image-4101\" \/><br \/>\n<\/Strong><div style=\"font-size:15px;\"><strong>Paper Title<\/Font><\/strong><br \/>\nThe importance of the atmospheric environment in EUV post-exposure events for metal oxide resists : from stability to optimization<br \/>\n<strong>Short Biography<\/strong><br \/>\nIvan Pollentier joined imec in 1993 after receiving a PhD in Physics engineering at the University of Gent (Belgium), where he was involved in lithography engineering and development of i-line, DUV and 193nm processes towards imec\u2019s device programs.  Since 2007, he is involved in resist and process related fundamental research in the field of EUV lithography.<br \/>\n<br \/>\n<\/td>\n<\/tr>\n<tr class=\"row-9\">\n\t<td colspan=\"2\" class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Prof. D. Howard Fairbrother, Johns Hopkins University, USA<\/Strong><\/Font><br \/>\n<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/imnc.jp\/2026\/wp-content\/uploads\/2026\/07\/Prof.Howard-Fairbrother.jpg\" alt=\"\" width=\"120\" height=\"120\" class=\"alignnone size-full wp-image-4091\" \/><br \/>\n<\/Strong><div style=\"font-size:15px;\"><strong>Paper Title<\/Font><\/strong><br \/>\nDry Processing and Development Strategies for Advanced Lithography and Patterning<br \/>\n<strong>Short Biography<\/strong><br \/>\nDr. D(avid) Howard Fairbrother is Professor of Chemistry at Johns Hopkins University, where his materials research focuses on surface chemistry, electron-surface interactions and more recently the development of dry processes for semiconductor technologies. He received his B.A. in Chemistry from the University of Oxford, England, and his Ph.D. in Chemistry from Northwestern University. He joined the Department of Chemistry at Johns Hopkins in 1997 following postdoctoral research at the University of California, Berkeley.<br \/>\n<br \/>\n<br \/>\n<\/td>\n<\/tr>\n<tr class=\"row-10\">\n\t<td class=\"column-1\"><strong><div style=\"font-size:18px;\"><Strong>Dr. Cheng Wang, Lawrence Berkeley National Laboratory, USA<\/Strong><\/Font><\/td><td class=\"column-2\"><\/td>\n<\/tr>\n<tr class=\"row-11\">\n\t<td colspan=\"2\" class=\"column-1\"><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<!-- #tablepress-17 from cache -->\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"uagb_featured_image_src":{"full":false,"thumbnail":false,"medium":false,"medium_large":false,"large":false,"1536x1536":false,"2048x2048":false,"page_builder_slider_small":false,"size1":false,"size2":false,"size3":false,"size4":false,"size5":false,"size6":false,"size7":false,"size8":false,"size9":false,"size10":false,"size11":false,"size12":false,"size-card":false},"uagb_author_info":{"display_name":"mnc2026","author_link":"https:\/\/imnc.jp\/2026\/author\/mnc2022\/"},"uagb_comment_info":0,"uagb_excerpt":null,"_links":{"self":[{"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/pages\/610"}],"collection":[{"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/comments?post=610"}],"version-history":[{"count":11,"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/pages\/610\/revisions"}],"predecessor-version":[{"id":1725,"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/pages\/610\/revisions\/1725"}],"wp:attachment":[{"href":"https:\/\/imnc.jp\/2026\/wp-json\/wp\/v2\/media?parent=610"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}